In-process Defect Monitoring and Correction in Additive Manufacturing of Aluminum Alloys
Behrooz Jalalahmadi, Jingfu Liu, Jason Rios, Sentient Science; John Slotwinski, John Hopkins University Applied Physics Lab
In-process Defect Monitoring and Correction in Additive Manufacturing of Aluminum Alloys
- Presented at Forum 75
- 14 pages
- SKU # : 75_2019_0081_Jalalahmadi
- Your Price : $30.00
Join or log in to receive the member price of $15.00!
In-process Defect Monitoring and Correction in Additive Manufacturing of Aluminum Alloys
Authors / Details: Behrooz Jalalahmadi, Jingfu Liu, Jason Rios, Sentient Science; John Slotwinski, John Hopkins University Applied Physics Lab
Recently Viewed Items
-
In-process Defect Monitoring and Correction in Additive Manufacturing of Aluminum Alloys
- Member Price :
- $15.00
- Your Price :
- $30.00
